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Author
Barth, W.
(1)
Bauerdick, S.
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Bucher, Volker
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Burkhardt, Claus J.
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Nisch, Wilfried
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Rudorf, R.
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Year of publication
2003 (1)
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Article (peer-reviewed)
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English
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Atomic force microscope (1)
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In-situ monitoring of electron beam induced deposition by atomic force microscopy in a scanning electron microscope
(2003)
Bauerdick, S.
;
Burkhardt, Claus J.
;
Rudorf, R.
;
Barth, W.
;
Bucher, Volker
;
Nisch, Wilfried
1
to
1