Test bench and quality measures for non-intrusive load monitoring algorithms
| Document Type: | Conference Proceeding |
|---|---|
| Author: | Philipp Klein, Jean Merckle, Dirk BenyoucefORCiDGND, Thomas Bier |
| DOI: | https://doi.org/10.1109/IECON.2013.6699946 |
| ISBN: | 978-1-4799-0224-8 |
| ISSN: | 1553-572X |
| Parent Title (English): | IECON 2013: 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, 10 - 14 November, 2013 |
| Language: | English |
| Year of Completion: | 2013 |
| Release Date: | 2018/06/12 |
| Tag: | Algorithm design and analysis; Classification algorithms; Detectors; Event detection; Home appliances; Switches; Vectors |
| First Page: | 5006 |
| Last Page: | 5011 |
| Open-Access-Status: | Closed Access |
| Licence (German): |  Urheberrechtlich geschützt |