Test bench and quality measures for non-intrusive load monitoring algorithms
Author: | Philipp Klein, Jean Merckle, Dirk BenyoucefORCiDGND, Thomas Bier |
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DOI: | https://doi.org/10.1109/IECON.2013.6699946 |
ISBN: | 978-1-4799-0224-8 |
ISSN: | 1553-572X |
Parent Title (English): | IECON 2013: 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, 10 - 14 November, 2013 |
Document Type: | Conference Proceeding |
Language: | English |
Year of Completion: | 2013 |
Release Date: | 2018/06/12 |
Tag: | Algorithm design and analysis; Classification algorithms; Detectors; Event detection; Home appliances; Switches; Vectors |
First Page: | 5006 |
Last Page: | 5011 |
Open-Access-Status: | Closed Access |
Licence (German): | ![]() |