The search result changed since you submitted your search request. Documents might be displayed in a different sort order.
  • search hit 5 of 13
Back to Result List

Test bench and quality measures for non-intrusive load monitoring algorithms

Export metadata

Additional Services

Share in Twitter Search Google Scholar
Metadaten
Author:Philipp Klein, Jean Merckle, Dirk BenyoucefGND, Thomas Bier
DOI:https://doi.org/10.1109/IECON.2013.6699946
ISBN:978-1-4799-0224-8
ISSN:1553-572X
Parent Title (English):IECON 2013: 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, 10 - 14 November, 2013
Document Type:Conference Proceeding
Language:English
Year of Completion:2013
Release Date:2018/06/12
Tag:Algorithm design and analysis; Classification algorithms; Detectors; Event detection; Home appliances; Switches; Vectors
First Page:5006
Last Page:5011
Open Access:Innerhalb der Hochschule
Licence (German):License LogoEs gilt das UrhG