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Test bench and quality measures for non-intrusive load monitoring algorithms

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Author:Philipp Klein, Jean Merckle, Dirk BenyoucefGND, Thomas Bier
Parent Title (English):IECON 2013: 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, 10 - 14 November, 2013
Document Type:Conference Proceeding
Year of Completion:2013
Release Date:2018/06/12
Tag:Algorithm design and analysis; Classification algorithms; Detectors; Event detection; Home appliances; Switches; Vectors
First Page:5006
Last Page:5011
Open Access:Innerhalb der Hochschule
Licence (German):License LogoEs gilt das UrhG