Current Understanding of the Fundamental Mechanisms of Doped and Loaded Semiconducting Metal-Oxide-Based Gas Sensing Materials
Author: | David DeglerORCiDGND, Udo Weimar, Nicolae Barsan |
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DOI: | https://doi.org/10.1021/acssensors.9b00975 |
ISSN: | 2379-3694 |
Parent Title (German): | ACS Sensors |
Document Type: | Article (peer-reviewed) |
Language: | German |
Year of Completion: | 2019 |
Release Date: | 2019/10/18 |
Volume: | 4.2019 |
Issue: | 9 |
First Page: | 2228 |
Last Page: | 2249 |
Licence (German): | Urheberrechtlich geschützt |