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Author
Kronast, Wolfgang
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Laskurain, Aritz J.
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Mescheder, Ulrich
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2004
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German
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Das Rasterkraftmikroskop (AFM) zur Charakterisierung und Strukturierung im Nanometerbereich
(2004)
Kronast, Wolfgang
;
Laskurain, Aritz J.
;
Mescheder, Ulrich
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