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Author
Marion, Philippe (1)
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Year of publication
2020
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Article (peer-reviewed)
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English
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Keywords
Johansson crystal analysers
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Tender x-rays
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Wavelength dispersive spectrometer
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X-ray instrumentation
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X-ray optics
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TEXS: in-vacuum tender x-ray emission spectrometer with eleven Johansson crystal analysers - SUPPORTING INFORMATION
(2020)
Rovezzi, Mauro
;
Harris, Alistair
;
Detlefs, Blanka
;
Bohdan, Timothy
;
Sviazhin, Artem
;
Santambrogio, Alessandro
;
Degler, David
;
Baran, Rafal
;
Reynier, Benjamin
;
Crespo, Pedro N.
;
Heyman, Catherine
;
Kleij, Hans-Peter Van der
;
Vaerenbergh, Pierre Van
;
Marion, Philippe
;
Vitoux, Hugo
;
Lapras, Christophe
;
Verbeni, Roberto
;
Kocsis, Menhard M.
;
Manceau, Alain
;
Glatzel, Pieter
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