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  • Barth, W. (1)
  • Bauerdick, S. (1)
  • Bucher, Volker (1)
  • Burkhardt, Claus J. (1)
  • Nisch, Wilfried (1)
  • Rudorf, R. (1)

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In-situ monitoring of electron beam induced deposition by atomic force microscopy in a scanning electron microscope (2003)
Bauerdick, S. ; Burkhardt, Claus J. ; Rudorf, R. ; Barth, W. ; Bucher, Volker ; Nisch, Wilfried
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