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Author
Pongratz, S. (4)
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1988
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1986
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1989
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Article (peer-reviewed)
(3)
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English
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German
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Sub‐half‐micron critical dimension control in x‐ray lithography mask technology
(1988)
Huber, H.-L.
;
Pongratz, S.
;
Trube, J.
;
Windbracke, W.
;
Mescheder, Ulrich
;
Mund, F.
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