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Author
Mund, F. (5)
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Year of publication
1988
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1989
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1987
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Article (peer-reviewed)
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Conference Proceeding
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English
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Linewidth metrology for x-ray masks with subhalfmicron feature size
(1987)
Mescheder, Ulrich
;
Mund, F.
;
Huber, H.-L.
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