A Reference Process and Domain Model for Machine Learning Based Production Fault Analysis
Author: | Christian Seiffer, Alexander Gerling, Ulf Schreier, Holger ZiekowGND |
---|---|
DOI: | https://doi.org/10.1007/978-3-030-75418-1_8 |
ISBN: | 978-3-030-75418-1 |
Parent Title (English): | Enterprise Information Systems : 22nd International Conference, ICEIS 2020, Virtual Event, May 5–7, 2020, Revised Selected Papers |
Publisher: | Springer |
Place of publication: | Cham |
Document Type: | Conference Proceeding |
Language: | English |
Year of Completion: | 2021 |
Release Date: | 2021/07/02 |
Tag: | Machine learning; Manufacturing; Reference model |
First Page: | 140 |
Last Page: | 157 |
Open-Access-Status: | Closed Access |
Licence (German): | ![]() |