Volltext-Downloads (blau) und Frontdoor-Views (grau)
The search result changed since you submitted your search request. Documents might be displayed in a different sort order.
  • search hit 1 of 15
Back to Result List

A Reference Process and Domain Model for Machine Learning Based Production Fault Analysis

Export metadata

Additional Services

Search Google Scholar

Statistics

frontdoor_oas
Metadaten
Author:Christian Seiffer, Alexander GerlingORCiD, Ulf SchreierGND, Holger ZiekowGND
DOI:https://doi.org/10.1007/978-3-030-75418-1_8
ISBN:978-3-030-75418-1
Parent Title (English):Enterprise Information Systems : 22nd International Conference, ICEIS 2020, Virtual Event, May 5–7, 2020, Revised Selected Papers
Publisher:Springer
Place of publication:Cham
Document Type:Conference Proceeding
Language:English
Year of Completion:2021
Release Date:2021/07/02
Tag:Machine learning; Manufacturing; Reference model
First Page:140
Last Page:157
Open-Access-Status: Closed Access 
Licence (German):License LogoUrheberrechtlich geschützt