In-situ and operando X-ray spectroscopy – a suitable tool to reveal the structure of noble metal doped sensing materials
Author: | David DeglerORCiDGND, Hudson W. Pereira de Carvalho, Jan-Dierk Grunwaldt, Udo Weimar, Nicolae Barsan |
---|---|
Parent Title (English): | IMCS 2014: The 15th International Meeting on Chemical Sensors, March 16th to 19th, 2014, Buenos Aires, Argentina |
Document Type: | Conference Proceeding |
Language: | English |
Year of Completion: | 2014 |
Release Date: | 2019/04/03 |
Licence (German): | Urheberrechtlich geschützt |