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In-situ and operando X-ray spectroscopy – a suitable tool to reveal the structure of noble metal doped sensing materials

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Author:David DeglerORCiDGND, Hudson W. Pereira de Carvalho, Jan-Dierk Grunwaldt, Udo Weimar, Nicolae Barsan
Parent Title (English):IMCS 2014: The 15th International Meeting on Chemical Sensors, March 16th to 19th, 2014, Buenos Aires, Argentina
Document Type:Conference Proceeding
Year of Completion:2014
Release Date:2019/04/03
Licence (German):License LogoEs gilt das UrhG