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Current Understanding of the Fundamental Mechanisms of Doped and Loaded Semiconducting Metal-Oxide-Based Gas Sensing Materials

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Author:David DeglerORCiDGND, Udo Weimar, Nicolae Barsan
DOI:https://doi.org/10.1021/acssensors.9b00975
ISSN:2379-3694
Parent Title (German):ACS Sensors
Document Type:Article (peer-reviewed)
Language:German
Year of Completion:2019
Release Date:2019/10/18
Volume:4.2019
Issue:9
First Page:2228
Last Page:2249
Licence (German):License LogoUrheberrechtlich geschützt