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Device Classification for NILM using FIT-PS compared with Standard Signal Forms

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Metadaten
Author:Daniel Weißhaar, Pirmin Held, Steffen Mauch, Dirk BenyoucefGND
DOI:https://doi.org/10.1109/CANDO-EPE.2018.8601150
ISBN:978-1-7281-1154-4
Parent Title (English):IEEE CANDO-EPE 2018 proceedings : IEEE International Conference and Workshop in Óbuda on Electrical and Power Engineering : November 20-21, 2018, Budapest, Hungary
Document Type:Conference Proceeding
Language:English
Year of Completion:2018
Release Date:2019/01/15
Tag:Classification; Frequency independent transformation of periodic signals; Non-intrusive load monitoring; Super- vised learning; Waveform
First Page:000079
Last Page:000084
Open Access:Innerhalb der Hochschule
Licence (German):License LogoEs gilt das UrhG