TEXS: in-vacuum tender x-ray emission spectrometer with eleven Johansson crystal analysers - SUPPORTING INFORMATION
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| Author: | Mauro Rovezzi, Alistair Harris, Blanka Detlefs, Timothy Bohdan, Artem Sviazhin, Alessandro Santambrogio, David DeglerORCiDGND, Rafal Baran, Benjamin Reynier, Pedro N. Crespo, Catherine Heyman, Hans-Peter Van der Kleij, Pierre Van Vaerenbergh, Philippe Marion, Hugo Vitoux, Christophe Lapras, Roberto Verbeni, Menhard M. Kocsis, Alain Manceau, Pieter Glatzel |
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| URN: | https://urn:nbn:de:bsz:fn1-opus4-63739 |
| DOI: | https://doi.org/10.1107/S160057752000243X |
| ISSN: | 1600-5775 |
| Parent Title (English): | Journal of Synchrotron Radiation |
| Document Type: | Article (peer-reviewed) |
| Language: | English |
| Year of Completion: | 2020 |
| Release Date: | 2020/04/09 |
| Tag: | Johansson crystal analysers; Tender x-rays; Wavelength dispersive spectrometer; X-ray instrumentation; X-ray optics |
| Volume: | 27.2020 |
| Issue: | May |
| First Page: | 813 |
| Last Page: | 826 |
| Open-Access-Status: | Open Access |
| Licence (German): |  Creative Commons - CC BY - Namensnennung 4.0 International |