Das Rasterkraftmikroskop (AFM) zur Charakterisierung und Strukturierung im Nanometerbereich

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Metadaten
Author:Wolfgang Kronast, Aritz J. Laskurain, Ulrich MeschederORCiDGND
ISSN:1432-9174
Parent Title (German):Horizonte
Document Type:Contribution to a Periodical
Language:German
Year of Completion:2004
Release Date:2018/01/26
Issue:25
First Page:3
Last Page:8
Open Access:Frei verf├╝gbar
Licence (German):License LogoEs gilt das UrhG