TY  - CHAP
U1  - Konferenzveröffentlichung
A1  - Seiffer, Christian
A1  - Gerling, Alexander
A1  - Schreier, Ulf
A1  - Ziekow, Holger
T1  - A Reference Process and Domain Model for Machine Learning Based Production Fault Analysis
T2  - Enterprise Information Systems : 22nd International Conference, ICEIS 2020, Virtual Event, May 5–7, 2020, Revised Selected Papers
KW  - Reference model
KW  - Machine learning
KW  - Manufacturing
Y1  - 2021
SN  - 978-3-030-75418-1
SB  - 978-3-030-75418-1
U6  - https://doi.org/10.1007/978-3-030-75418-1_8
DO  - https://doi.org/10.1007/978-3-030-75418-1_8
SP  - 140
EP  - 157
PB  - Springer
CY  - Cham
ER  -