TY  - JOUR
U1  - Zeitschriftenartikel, wissenschaftlich - begutachtet (reviewed)
A1  - Heid, Andreas
A1  - Metzen, Rene P. von
A1  - Stett, Alfred
A1  - Bucher, Volker
T1  - Examination of dielectric strength of thin Parylene C films under various conditions
JF  - Current Directions in Biomedical Engineering
KW  - Dielectric strength
KW  - Encapsulation
KW  - Implant
KW  - Insulation
KW  - Parylene C
Y1  - 2016
UN  - https://nbn-resolving.org/urn:nbn:de:bsz:fn1-opus4-20239
SN  - 2364-5504
SS  - 2364-5504
U6  - https://doi.org/10.1515/cdbme-2016-0012
DO  - https://doi.org/10.1515/cdbme-2016-0012
VL  - 2.2016
IS  - 1
SP  - 39
EP  - 41
ER  -