TY  - CHAP
U1  - Konferenzveröffentlichung
A1  - Klein, Philipp
A1  - Merckle, Jean
A1  - Benyoucef, Dirk
A1  - Bier, Thomas
T1  - Test bench and quality measures for non-intrusive load monitoring algorithms
T2  - IECON 2013: 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, 10 - 14 November, 2013
KW  - Home appliances
KW  - Event detection
KW  - Vectors
KW  - Algorithm design and analysis
KW  - Detectors
KW  - Classification algorithms
KW  - Switches
Y1  - 2013
SN  - 1553-572X
SS  - 1553-572X
SN  - 978-1-4799-0224-8
SB  - 978-1-4799-0224-8
U6  - https://doi.org/10.1109/IECON.2013.6699946
DO  - https://doi.org/10.1109/IECON.2013.6699946
SP  - 5006
EP  - 5011
ER  -