@inproceedings{KleinMerckleBenyoucefetal.2013,
  author    = {Philipp Klein and Jean Merckle and Dirk Benyoucef and Thomas Bier},
  title     = {Test bench and quality measures for non-intrusive load monitoring algorithms},
  series = {IECON 2013: 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, 10 - 14 November, 2013},
  isbn      = {978-1-4799-0224-8},
  issn      = {1553-572X},
  doi       = {10.1109/IECON.2013.6699946},
  pages     = {5006 -- 5011},
  year      = {2013},
  language  = {en}
}